DA-400 Contour Probe

$572.00

SKU: DA400 Category:

Description

  • IP51
  • Versatility and powerful performance in a lightweight (8.5 lbs.) instrument
  • Constant AC or Half Wave Rectified (DC) fields with the flip of a switch for the location of surface and some sub-surface defects
  • Apply continuous fields and demagnetize too
  • Use with dry powder, wet fluorescent or visible
  • High impact molded housing
  • One year repair/replacement guarantee
  • Optional Y-400 Yoke Light where shown is available at additional cost.
  • 230VAC model available with CE certification at an additional cost

The DA-400 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferrous-magnetic materials.

The selective AC and DC functions are built into a single reliable instrument. The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense Half Wave Rectified (DC) field for detection of some subsurface defects.

Controls and solid-state electronics are contained within the high impact molded housing. Articulating legs allow the AC or DC field to be applied to the precise area of inspection on nearly any part of the surface shape… in the lab, factory or field site.

All Parker Contour Probes comply with the requirements of applicable specifications.

SPECIFICATIONS

Unit

DA-400

DA-400S

A-410

A-410S

Physical

10 H × 8 L × 2.25 W

Line Voltage Single Phase 115 VAC
60 Hz
230 VAC
50/60 Hz
115 VAC
60 Hz
230 VAC
50/60 Hz
Line Current 6 A
3 A
6 A
3 A
Duty Cycle

50%

Weight 8.5 lbs (3.8 kg)
Construction

Glass-filled nylon housing
10 foot (3 m) 3-wire power cord

Span

12 in. (305 mm) across poles

Field AC/DC AC/DC AC AC

 

DA400-Product-Data-SheetDownload Data Sheet

Parker Research Corporation sets NDT Standards for Reliability
and Innovation for Magnetic Particle Testing Instruments & Accessories

Contact Us

Parker Research Corporation
P.O Box 1406
Dunedin FL 34697-1406, U.S.A.

Toll Free: (800) 525-3935

Local and International:
(727) 796-4066

Fax: (727) 797-3941



Contour Probe® is a registered trademark of Parker Research Corporation.