DA-200 Contour Probe

$587.00

SKU: DA200 Category:

Description

  • IP51
  • Versatility and powerful performance in a rugged, reliable instrument
  • Constant AC or Half Wave Rectified (DC) fields with the flip of a switch; for the location of surface and some sub-surface defects
  • Apply continuous magnetic fields and demagnetize too
  • Use with dry powder, wet fluorescent or visible
  • High impact-molded housing
  • One-year repair/replacement guarantee
  • 230VAC model available with CE certification at an additional cost

The DA-200 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferrous-magnetic materials. The selective AC and DC functions are built into a single reliable instrument.

The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense Half Wave Rectified DC field for detection of some sub-surface defects. Combined with the flexibility of articulating legs and a rugged molded housing, the Contour Probe can be used on nearly any part or surface contour… in the lab, factory, or field site.

Your magnetic particle applications need the versatility and reliable performance advantages of the Parker Contour Probe. An industry standard with 45 years of NDT service.

SPECIFICATIONS

DA-200

DA-200S

A-210

A-210S

Physical

11 H × 10.75 L × 2.75 W

Line Voltage Single Phase 115 VAC
60 Hz
230 VAC
50/60 Hz
115 VAC
60 Hz
230 VAC
50/60 Hz
Line Current 6 A
AC/DC
4 A
AC/DC
9.5 A
AC
4 A
AC
Duty Cycle

50%

Weight 12 lbs (5.44 kg)
Construction

Glass-filled nylon housing
10 foot (3 m) 3-wire power cord

Span

18 in. (457 mm) across poles

Field AC/DC AC/DC AC AC

 

DA200-Product-Data-SheetDownload Data Sheet

Parker Research Corporation sets NDT Standards for Reliability
and Innovation for Magnetic Particle Testing Instruments & Accessories

Contact Us

Parker Research Corporation
P.O Box 1406
Dunedin FL 34697-1406, U.S.A.

Toll Free: (800) 525-3935

Local and International:
(727) 796-4066

Fax: (727) 797-3941



Contour Probe® is a registered trademark of Parker Research Corporation.